Abstract
Copper sulfide minerals, such as chalcocite (Cu₂S) and enargite (Cu₃AsS₄), are important sources of copper, which has wide applications in electronics, energy, and other industries. These minerals are traditionally processed using flotation methods, which are one of the most effective ways to extract copper from sulfide ores. However, the success of flotation of copper sulfides, such as chalcocite and enargite, strongly depends on changes in their surface properties, such as hydrophobicity or hydrophilicity, which can be modified by various chemical reagents. To further understand the impact of these chemical reagents on chalcocite and enargite minerals, X-ray photoelectron spectroscopy (XPS) was used in this study to analyze changes in the chemical composition of the surface of these minerals after treatment with different concentrations of hydrogen peroxide (1 mM and 10 mM) and PAX (0.002 mM). The results of the XPS analyses showed how the chemical states of copper, sulfur, and arsenic on the surface of the minerals change, as well as how these changes affect their flotation characteristics.
Recommended Citation
DANIYAROV, Berdakh T.; HAJIME, Miki; RUZIEVA, Baxtigul Y.; and DAMINOVA, Shahlo Sh.
(2025)
"X-RAY PHOTOELECTRON SPECTROSCOPY INVESTIGATION OF SURFACE CHANGES IN CHALCOCITE AND ENARGITE MINERALS FOLLOWING OXIDATION TREATMENT,"
CHEMISTRY AND CHEMICAL ENGINEERING: Vol. 2024:
No.
4, Article 6.
DOI: https://doi.org/10.59048/cce202446
Available at:
https://cce.researchcommons.org/journal/vol2024/iss4/6